KLA-Tencor Corporation (KLAC) : Traders are bullish on KLA-Tencor Corporation (KLAC) as it has outperformed the S&P 500 by a wide margin of 2.71% in the past 4 weeks. The bullishness in the stock continues even in the near-term as the stock has returned an impressive 2.1%, relative to the S&P 500. The stock has continued its bullish performance both in the near-term and the medium-term, as the stock is up 2.54% in the last 1 week, and is up 5.26% in the past 4 weeks. Buying continues as the stock moves higher, suggesting a strong appetite for the stock.
KLA-Tencor Corporation (NASDAQ:KLAC): During Fridays trading session, Bulls were in full control of the stock right from the opening. The stock opened at $76.94 and $76.80 proved to be the low of the day. Continuous buying at higher levels pushed the stock towards an intraday high of $77.63. The buying momentum continued till the end and the stock did not give up its gains. It closed at $77.63, notching a gain of 1.08% for the day. The total traded volume was 431,291 . The stock had closed at $76.80 on the previous day.
The stock has recorded a 20-day Moving Average of 2.24% and the 50-Day Moving Average is 4.81%. KLA-Tencor Corporation is up 12.76% in the last 3-month period. Year-to-Date the stock performance stands at 13.7%.
KLA-Tencor Corporation (KLAC) has been rated by 5 research analysts. Fundamentally, the highest shorterm price forecast for the stock is expected to reach $79 and the lowest price target forecast is $59. The average forecast of all the analysts is $71.8 and the expected standard deviation is $9.2.
KLA-Tencor Corporation is a supplier of process control and yield management solutions for the semiconductor and related nanoelectronics industries. The Companys products are also used in various other industries, including the light emitting diode (LED) and data storage industries, as well as general materials research. KLA-Tencors products and services are used by bare wafer, integrated circuit (IC), lithography reticle and disk manufacturers around the world. These customers turn to the Company for inline wafer and IC defect monitoring, review and classification; reticle defect inspection and metrology; packaging and interconnect inspection; critical dimension (CD) metrology; pattern overlay metrology; film thickness, surface topography and composition measurements; measurement of in-chamber process conditions, wafer shape and stress metrology; computational lithography tools, and overall yield and fab-wide data management and analysis systems.